By Daniel Malacara

Actual Optics and light-weight Measurements, (Methods in Experimental Physics quantity 26 )

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Reflectance curve for a quarter-wave stack. I 700nrn 37 M ULTI PLE-PASS I N T E R F E R O M E T E R S -==--+I ,test l M lens 3 FIG. 39. Double-pass Twyman-Green and Fizeau interferometers. 4. Multiple-Pass Interferometers These are interferometers in which at least one of the wave fronts traverses the normal trajectories more than once. The instruments, which have been described in detail by H a r i h a ~ - a nand ~ ~ by Langenbe~k,~’ have some advantages, as we shall see in this section. A double-pass interferometer is designed with the purpose of separating the symmetrical and the antisymmetrical parts of the wave aberration and to display them in separate interferograms.

Using the arrangements in Figs. 14(b) and 14(c), the quality of a lens or photographic objective can be tested. It is assumed in this test that the convex or concave mirrors are perfectly spherical. If the lenses are assumed to be perfect, the quality of the spherical mirror is tested. Interference patterns associated with various lens aberrations are shown in Fig. 15. Many FIG. 15. Some Twyman-Green interferograrns. TWO-BEAM INTERFEROMETERS 17 other types of optical elements, such as prisms and diffraction gratings, can also be tested with this interferometer.

53. P. N. Puntambekar and D. Sen, “A Simple Inverting Interferometer,” Opt. Acta 18, 719 (1971 ). 54. W. E. Williams, “Applications of Interferometry,” in Concepfs of Classical Opfics (J. ), p. 373, W. H. Freeman, San Francisco, 1958. 55. J. , Brighton, 1970. 56. P. Mollet, Opfics in Mefrology, Pergamon Press, Oxford, 1960. 57. A. A. Michelson and M. Morley, Silliman J. 34, 333 (1887). 58. R. B. Leighton, Principles of Modern Physics, Chap. 1, McGraw-Hill, New York, 1959. 59. T. S. Jaseja, A. Javan, J.

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