By Shichun Qu, Yong Liu
Analog and gear Wafer point Chip Scale Packaging offers a state-of-art and in-depth assessment in analog and tool WLCSP layout, fabric characterization, reliability and modeling. fresh advances in analog and tool digital WLCSP packaging are offered in response to the advance of analog know-how and gear gadget integration. The e-book covers intimately how advances in semiconductor content material, analog and tool complicated WLCSP layout, meeting, fabrics and reliability have co-enabled major advances in fan-in and fan-out with redistributed layer (RDL) of analog and tool gadget potential in the course of contemporary years. because the analog and gear digital wafer point packaging isn't like standard electronic and reminiscence IC package deal, this e-book will systematically introduce the common analog and tool digital wafer point packaging layout, meeting method, fabrics, reliability and failure research, and fabric choice. besides new analog and tool WLCSP improvement, the function of modeling is a key to guarantee winning package deal layout. an summary of the analog and tool WLCSP modeling and commonplace thermal, electric and rigidity modeling methodologies is usually awarded within the e-book.
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Additional resources for Wafer-Level Chip-Scale Packaging: Analog and Power Semiconductor Applications
Example text
It could be challenging creating wafer maps if yield at either step is low. Fortunately high-yielding fab and bumping could always be expected for test chips due to easy metal layout. Third, the modular design test chip will likely end up with discontinued passivation (SiN) and repassivation (polymer) coverage due to saw street within the final die area. This is quite different from any regular WLCSP chip, which always features continuous passivation (SiN) and repassivation (polymer) across the whole die area and only terminates in the saw street around the die perimeters.
All solder joints in the center section will only be checked when test stopped. There are concerns about this aggressive daisy chain layout. One is about missing registrations of solder joint failures that is not at locations being continuously monitored. The supporting evidence of this concern is described in the previous section (Fig. 11), where non-corner balls failed in TMCL. To address this concern, one has to look into the differences between a test chip and a real functional chip: test chip typically has uniform on-chip layer stack from bump to bump, while real chip typically has different on-chip layer stack from 28 2 Fan-In Wafer-Level Chip-Scale Package bump to bump.
3). Knowing the effect of silicon thickness and BSL will help make decisions when designing test chip and selecting all the parameters. Since the main role of a test chip is to confirm the reliability performance and reveal all potential risks surrounding a particular WLCSP technology approach, it is generally desired to test the worse case conditions, which means thick silicon thickness, if possible, for a test chip. 5. PCB trace orientation PCB trace orientation next to the soldering pad is as important as daisy chain design itself.
