By Alexander A. Demkov, Alexandra Navrotsky

This publication offers the basics of novel gate dielectrics which are being brought into semiconductor production to make sure the continual scaling of CMOS units. As it is a quickly evolving box of analysis we elect to target the fabrics that ensure the functionality of machine purposes. each one of these fabrics are transition steel oxides. sarcastically, the d-orbitals liable for the excessive dielectric consistent reason critical integration problems, therefore intrinsically restricting high-k dielectrics. notwithstanding new within the electronics a lot of those fabrics are recognized within the box of ceramics, and we describe this targeted connection. The complexity of the structure-property family members in TM oxides calls for using cutting-edge first-principles calculations. numerous chapters provide a close description of the fashionable idea of polarization, and heterojunction band discontinuity in the framework of the density practical thought. Experimental equipment contain oxide soften resolution calorimetry and differential scanning calorimetry, Raman scattering and different optical characterization strategies, transmission electron microscopy, and X-ray photoelectron spectroscopy.

Many of the issues encountered on this planet of CMOS also are proper for different semiconductors resembling GaAs. A accomplished evaluate of contemporary advancements during this box is hence additionally given. The booklet may be of curiosity to these actively engaged in gate dielectric learn, and to graduate scholars in fabrics technological know-how, fabrics Physics, fabrics Chemistry, and electric Engineering.

Show description

Read Online or Download Materials fundamentals of gate dielectrics PDF

Best optics books

Nonlinear Optics of Random Media: Fractal Composites and Metal-Dielectric Films (Springer Tracts in Modern Physics)

Nonlinear Optics of Random Media studies fresh advances in in a single of the main well known fields of physics. It presents an overview of the fundamental types of abnormal constructions of random inhomogeneous media and the methods used to explain their linear electromagnetic homes. Nonlinearities in random media also are mentioned.

Optical Imaging and Metrology: Advanced Technologies

A accomplished evaluate of the cutting-edge and advances within the box, whereas additionally outlining the long run power and improvement traits of optical imaging and optical metrology, a space of quickly development with quite a few functions in nanotechnology and nanophysics. Written by way of the world's major specialists within the box, it fills the distance within the present literature by way of bridging the fields of optical imaging and metrology, and is the single up to date source by way of primary wisdom, simple techniques, methodologies, purposes, and improvement traits.

Field Guide to Diffractive Optics (SPIE Field Guide Vol. FG21)

Fresh developments in microfabrication applied sciences and the advance of robust simulation instruments have ended in an important growth of diffractive optics and diffractive optical elements. software builders can choose between a large diversity of diffractive optics parts to enrich refractive and reflective parts in attaining a wanted keep watch over of the optical box.

Extra resources for Materials fundamentals of gate dielectrics

Example text

Ramon, B. Hradsky, R. Nieh, R. Rao, R. Raw, C. Hobbs, R. Garcia, J. B. La, K. Reed, P. -Y. Nguyen, B. White, R. Droopad, J. Curless, J. Finder, and K. Eisenbeiser of Motorola, as well as J. Noilien and S. Campbell of the University of Minnesota for various technical contributions. REFERENCES 1. M. Schulz, Nature 399, 729–730 (1999). 2. J. Robertson, J. V Vac. Sci. Technol. B 18, 1785 (2000). 3. F. Z. G. Y. Kim, R. Vrtis, D. L. Kwong, IEDM Tech. Dig 609 (1998). 4. B. He, T. A. L. Gladfelter, IEDM Tech.

Lett. 81, 3014 (1998). 12. Z. Yu, J. A. D. M. Finder, R. W. A. J. Ooms, V. Kaushik, J. V Vac. Sci. Technol. B 18, 2139 (2000). 13. A. Chambers, Y. Liang, Z. Yu, R. Droopad, J. Ramdani, K. Eisenbeiser, Appl. Phys. Lett. 77, 1662 (2000). 36 RAN LIU 14. X. A. Demkov, H. Li, X. Hu, Y. Wei, J. Kulik, Phys. Rev. B68, 125323 (2003). 15. H. Li, X. Hu, Y. Wei, Z. Yu, X. Zhang, R. A. Demkov, J. Edwards, K. Moore, W. Ooms, J. Kulik, P. Fejes, J. Appl. Phys. 93, 4521 (2003). 16. R. Liu, S. Zollner, P. Fejes, R.

H. A. B. -J. C. Wann, S. J. -S. Wong, CMOS scaling into the nanometer regime, Proc. IEEE, 85(4), 486–504 (1997). 8. D. H. Dennard, E. M. Solomon, Y. -S. P. Wong, Device scaling limits of Si MOSFETs and their application dependencies, Proc. IEEE, 89(3), 259–288 (2001). 9. A. Toriumi, Reliability perspective of high-k gate dielectrics—What is different from SiO2? in: 2002 7th international symposium on plasma and process induced damage, 4–9 (2002). 10. H. J. DiMaria, Reliability projection for ultra-thin oxides at low voltage, Int.

Download PDF sample

Rated 4.49 of 5 – based on 19 votes