By H. Philip Stathl
Hidden copyright marks were proposed as an answer for fixing the unlawful copying and evidence of possession difficulties within the context of multimedia gadgets. Many platforms were proposed, however it remains to be tough to have even a coarse inspiration in their performances and therefore to check them. So we first describe a few common assaults on audio and photo marking platforms. Then we recommend a benchmark to match photograph making software program on a good foundation. This benchmark relies on a collection of assaults that any process should live to tell the tale.
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Extra resources for Optical Manufacturing and Testing II: 27-29 July 1997, San Diego, California (Proceedings / Spie--The International Society for Optical En)
Example text
Although the basic list was compiled by the author of this section, all the editors have contributed and agreed to this set of symbols and definitions. Every attempt has been made to use the same symbols for the same concepts throughout the entire Handbook, although there are exceptions. Some symbols seem to be used for many concepts. The symbol a is a prime example, as it is used for absorptivity, absorption coefficient, coefficient of linear thermal expansion, and more. Although we have tried to limit this kind of redundancy, we have also bowed deeply to custom.
The receiver in Fig. 3b is in better accordance with the strict definition of BRDF in that a collimated source can be used. An aperture is located one focal length behind a collecting lens (or mirror) in front of the detector. The intent is to measure bundles of nearly parallel rays scattered from the sample. The angular spread of rays allowed to pass to the detector defines the receiver solid angle, which is equal to the aperture size divided by the focal length of the lens. This ratio (not the front aperture/sample distance) determines the solid angle of this receiver configuration.
It is also used to measure the quality of optical coatings and bulk optical materials. This chapter reviews basic issues associated with scatter metrology and touches on various industrial applications. The pioneering scattering instrumentation1–32 work started in the 1960s and extended into the 1990s. 33–36 Understanding the measurements and the ability to repeat results and communicate them led to an expansion of industrial applications, scatterometry has become an increasingly valuable source of noncontact metrology in industries where surface inspection is important.
